The objective of the IEC 62804 standard, "System voltage durability test for crystalline silicon modules-design qualification and type approval", is to evaluate crystalline silicon PV module ...
Results from PID stress tests can be misleading when bifacial PV modules are PID-stressed from just one side using the foil method in IEC TS 62804, according to a new study by Belgian researchers. An ...
Yingli Green Energy Holding’s advised that its multicrystalline PV modules had undergone, and successfully passed, potential induced degradation (PID) testing, which was conducted by Intertek Group.
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